Hi ,
We are using SN74LVC2G08QDCURQ1 in our project application.
I tried measuring input leakage current of the device at 25 deg and it was around 8.6 uA, while at -40 deg it is 300uA.
Is there any relation between input leakage current and temperature?
What is the reason behind this huge deviation?
Current can leak through the gate isolation of the input transistors, and through the ESD protection diodes. In practice, only the latter matters, and the leakage indeed increases with temperature. This graph for a different device shows the typical behaviour:
The guaranteed maximum is only 5 µA. How did you measure this?
Hi clemens ,
Thanks for your response,
I measured the leakage current with a 6.5 digit multimeter
This is the test circuit used.
While measuring the leakage current of one input pin, the other input is left open.
